Document Properties | |
---|---|
Feedback to: | Holly Krijgsman |
Published: | 12-04-2011 |
Public Document |
CNES / ESA Final Presentation Days 2011
28th and 29th March 2011
ESTEC / ESA ( The Netherlands )
Radiation Characterization of various FRAM, SRAM and Flash Memories by Frederic Lochon, ALTER
SEGR on Power MOSFETs - Nathalie Chatry, TRAD
In flight data from CARMEN2/MEX experiment: SEE on memories - Anne Samaras, CNES
Reverse Monte Carlo tools in FASTRAD -Pierre Pourrouquet, TRAD
Displacement damage, defects generation in image sensors -Christophe Inguimbert, ONERA
Influence of gamma and proton radiation on COTS Silicon and Indium Phosphide based photodiodes and determination of end-of-mission performance through modeling - Guillaume Pedroza ADVEOTEC
Dose rate and static/dynamic bias effects on CCDs degradation - Thierry Nuns, ONERA
Characterization, modeling and storage of radiation induced attenuation within optical fibres -Matthieu Caussanel, Université de Perpignan
Reliability assessment of optoelectronic and photonic devices in severe environments: architecture and applications of the OpERaS consortium -Laurent Bechou, Piero Spezzigu, IMS
MUSCA SEP3, a Mulit-Scale and Multi-Physics method to investigate the Single Event Effects for Space Mission -Sophie Duzellier, ONERA
Optimisation of SEE rates predictions - Nicolas Sukhaseum, TRAD
RadFET development and calibration - Aleksandar Jaksic, Tyndall
ACTEL Flash FPGA irradiation tests results - Michael Grandjean, ALTER
Irradiation characterization of DDR2 and SDRAM -Michael Grandjean, ALTER
Studies of Radiation SEE Effects in NAND-Flash and DDR types of memories - Fritz Gliem, Kai Grürmann, Dietmar Walter, IDA
SEE radiation test results in 90-65-45-40-32nm technologies - Philippe Roche, Gilles Gasiot, ST Microelectronics
Radiation Assessment of DSM CMOS devices - Cor Claeys, Eddy Simoen, IMEC
PSI radiation test facility status report - Wojtek Hajdas, PSI
UCL irradiation test facility status report -Guy Berger, UCL
RADEF irradiation test facility status report - Ari Virtanan, Jyväskylä University
Verification of Enhanced low dose rate sensitivity accelerated test method - Peter Beck, AIT
Study of ELDRS dose rate dependency - Sophie Duzellier, ONERA
SEGR/SEB Radiation Test Method Study - Christian Binois, EADS Astrium
Using TPA laser testing for characterizing the depth of SEE sensitive volumes - Frederic Darracq, IMS
Improvements of laser bench test set-up and its validation by testing memories - Andrew Chugg, MBDA
Integrated Radiation Environment, Effects and Component Degradation Simulation Tool - Ana Keating, LIP/ESA
Technology Demonstration Module On-Board PROBA-II - Reno Harboe-Sørensen
ESA year 2011 - Ongoing / new component radiation effects related R&D activities - Ali Zadeh, ESA