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5202001_Issue_2_-_Draft_A.pdf



Item 12: Change item 12 wording from “…(was hfe) and MIL-STD-750 Test Method corrected to 3306 (was 3206).” to “…(was hfe), MIL-STD-750 Test Method corrected to 3306 (was 3206) and IC Test Condition amended to be -20mA (was -50mA).”






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