Doc. or Spec. No. |
Issue |
Specification Title |
Additional documents |
2025000 |
1 |
Ckecklist for Semiconductors Manufacturer and Line Survey |
|
2045000 |
1 |
Internal Visual Inspection of Discrete Non-Microwave Semiconductors |
|
2055000 |
1 |
External Visual Inspection of Discrete Non-Microwave Semiconductor Devices |
|
2095000 |
1 |
Radiographic Inspection of Discrete Non-Microwave Semiconductors |
|
2135000 |
1 |
Terms Definitions Abbreviations Symbols ans Units for Discrete Non-Microwave Semiconductor Devices |
|
2145000 |
2 |
Scanning Electron Miscroscope (SEM) Inspection of Semiconductor Dice for Discrete Non-Microwave Semiconductor Devices |
|
2145000 |
1 |
Scanning Electron Miscroscope (SEM) Inspection of Semiconductor Dice for Discrete Non-Microwave Semiconductor Devices |
|
2265000 |
3 |
Evaluation Test Programme for Discrete Non-Microwave Semiconductors |
|
2265000 |
2 |
Evaluation Test Programme for Discrete Non-Microwave Semiconductors |
|
2265000 |
1 |
Evaluation Test Programme for Discrete Non-Microwave Semiconductors |
|
5000 |
9 |
Generic Specification for Discrete Semiconductor Components |
|
5000 |
8 |
Generic Specification for Discrete Semiconductor Components |
|
5000 |
7 |
Generic Specification for Discrete Semiconductor Components |
|
5000 |
6 |
Generic Specification for Discrete Semiconductor Components |
|
5000 |
5 |
Generic Specification for Discrete Semiconductor Components |
|
5000 |
4 |
Generic Specification for Discrete Semiconductor Components |
|
5000 |
3 |
Generic Specification for Discrete Semiconductor Components |
|
5000 |
2 |
Generic Specification for Discrete Semiconductor Components |
|
5000 |
1 |
Generic Specification for Discrete Semiconductor Components |
|