Document Properties | |
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Feedback to: | Anastasia Pesce |
Published: | 17-04-2018 |
Public Document |
ESA / SCC Specifications for Transistors and Diodes (Generic and Sectional Basic Specifications)
The ESA/SCC System is OBSOLETE and is superseded by the ESCC System .
Specifications for Transistors and Diodes (Generic and Sectional Basic Specifications)
All specification links are to pdf files with an average file size of 1 to 2 MB.
Doc. or Spec. No. | Issue | Rev. | Specification Title |
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2025000 | 1 | Ckecklist for Semiconductors Manufacturer and Line Survey | |
2045000 | 2 | Internal Visual Inspection of Discrete Non-Microwave Semiconductors | |
2055000 | 1 | A | External Visual Inspection of Discrete Non-Microwave Semiconductor Devices |
2095000 | 1 | Radiographic Inspection of Discrete Non-Microwave Semiconductors | |
2135000 | 1 | Terms Definitions Abbreviations Symbols ans Units for Discrete Non-Microwave Semiconductor Devices | |
2145000 | 1 | A | Scanning Electron Miscroscope (SEM) Inspection of Semiconductor Dice for Discrete Non-Microwave Semiconductor Devices |
2265000 | 1 | A | Evaluation Test Programme for Discrete Non-Microwave Semiconductors |
5000 | 9 | A | Generic Specification for Discrete Semiconductor Components |