| Document Properties | |
|---|---|
| Feedback to: | Andrew Barnes |
| Published: | 01-01-2006 |
| Public Document | |
Wide Band Gap: ESTEC Components Division
ESA Components Division Activities on Wide Band Gap Technologies
The following table summarises the on-going activities
| Domain | Title | Prime contractor | Objective | Additional information | Status |
|---|---|---|---|---|---|
| GaN | Athena | IMEC | Activity to develop high quality epitaxial growth techniques |
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Ongoing |
| GaN | Noise assessment of GaN structures | QinetiQ | Assessment of the low frequency and RF noise performance of wide bang gap devices, including receiver overdrive measurements, transmit/receive module simulation, oscillator phase noise eveluation |
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Completed |
| GaN | Noise assessment of GaN structures | Thales | Assessment of the low frequency and RF noise performance of wide bang gap devices, including receiver overdrive measurements, transmit/receive module simulation, oscillator phase noise eveluation |
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|
Completed |
| GaN and SiC | Power and thermal management of wide band gap semiconductors | Inasmet | Investigation and demonstration of novel thermal management techniques | Benoît Lambert | Ongoing |
| GaN | X-band TT+C SSPA | TESAT and FBH | Development of a hermetically packaged transistor family for realisation of a 30W X-band power amplifier |
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Ongoing |
| GaN | EPI-GaN | IMEC | Establish a small scale production facility for supply of GaN epitaxial wafers |
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Ongoing |
| GaN | Microwave frequency capability of wide band gap semiconductors | TNO and IAF | Investigation of the microwave and mm-wave frequency potential of GaN HEMTs; device demonstration at 30GHz, 60GHz and 94GHz |
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Ongoing |
| SiC | Components for High Power Conditioning Applications | Crisa | Investigation of P-doped material and metallization scheme, enabling development and characterisation of JBS (Junction Barrier Schottky) diode, PIN diode and bipolar transistor. | Benoît Lambert | Ongoing |

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