| Doc. or Spec. No. |
Issue |
Specification Title |
Additional documents |
 2025000 |
2 |
Ckecklist for Semiconductors Manufacturer and Line Survey |
|
| 2045000 |
2 |
Internal Visual Inspection of Discrete Non-Microwave Semiconductors |
|
| 2055000 |
2 |
External Visual Inspection of Discrete Non-Microwave Semiconductor Devices |
|
| 2095000 |
2 |
Radiographic Inspection of Discrete Non-Microwave Semiconductors |
|
| 2135000 |
2 |
Terms Definitions Abbreviations Symbols ans Units for Discrete Non-Microwave Semiconductor Devices |
|
| 2145000 |
3 |
Scanning Electron Miscroscope (SEM) Inspection of Semiconductor Dice for Discrete Non-Microwave Semiconductor Devices |
|
| 2265000 |
4 |
Evaluation Test Programme for Discrete Non-Microwave Semiconductors |
|
| 2545000 |
1 |
REQUIREMENTS FOR THE TECHNOLOGY FLOW QUALIFICATION OF DISCRETE SEMICONDUCTOR COMPONENTS |
|
| 5000 |
11 |
Discrete Semiconductor Components, Hermetically Sealed and Die |
|
