Document Properties | |
---|---|
Feedback to: | Laurent Marchand |
Published: | 25-01-2003 |
Public Document |
ESA MNT4: Session 6
Chair: Dominique Collard (IEMN) and Ralf de Marino (ESA)
-
MEMS Behavioral Simulation: A Potential Use for Physics of Failure (PoF ) Modeling Schmitt, P. (CNES-LAAS-EADS-LV); Esteve, D. (LAAS); Fourniols, J-Y. (LAAS); Lafontan, X. (MEMSCAP); Pons, P. (LAAS); Nicot, J-M. (CNES); Pressecq, F. (CNES); Oudea, C. (EADS-LV)
-
MEMS for Space Applications: A Reliability Study Barthe, S. (Astrium); Pressecq, F. (CNES); Marchand, L. (ESA/ESTEC)
-
Quality Assurance in Complex Microsystem Development Kohler, J. (Uppsala University); Marchand, L. (ESA/ESTEC); Stenmark, L. (Uppsala University)
-
Investigation of the Aging of Micromachined Silicon Actuators Dommann, A. (NBT, Interstate University)
-
Reliability of RF-MEMS De Wolf, I. (IMEC)
-
Reliability Assessment and Lifetime Testing with Micro-Mirrors Manhart, S. (Astrium GmbH); Schenk, H. (Fraunhofer-Institut fur Photonische Mikrosysteme); Kiening, M. (Neuland Industriedesign); Marchand, L. (ESA/ESTEC)
-
Evaluation of Process Reliability with Micromechanica Test Structures Dardalhon, M. (CNES); Pressecq, F. (CNES); Nouet, P. (LIRMM); Latorre, L. (LIRMM); Oudea, C. (EADS-LV)