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Feedback to: Paul McCormack
Published: 14-07-2009
Public Document

National Semiconductor GmbH - Radiation Test Reports

National Semiconductor GmbH

1528
Hi-Rel Operations
Livry Gargan Strasse 10
D-82256 Fuerstenfeldbruck
Germany
Tel : +49 8141 35 1468
External link icon www.national.com

National Semiconductor Radiation Reports

National Semiconductor Hi-Rel Operations group performs several types of radiation tests on its products including low dose rate TiD at 12mrad per second, high dose rate TiD at 50rads per second and SEE when applicable.
Below is a list of the radiation test reports available from National Semiconductor Hi-Rel Operations.

A description of High dose and Low dose radiation guaranteed part number nomenclature can be found under the following link : TiD Nomenclature description

TiD tests reports at high dose rate and low dose rate

 

Part Number Description TiD High Dose rate TiD Low Dose rate Test keys
ADC10D1000 Dual 10 bit 1 GSPS Low Power CMOS ADC designed in Germany      
ADC08D1000
Commercial die
Dual 8 bit 1 GSPS Low Power CMOS ADC designed in Germany resource download icon Test Report    
LMP2012
High Precision no 1/f noise, low offset voltage and low offset drift versus time and temperature
resource download icon Test Report    
LMH6628 Dual Wideband, Low Noise, Voltage Feedback Op Amp resource download icon Test Report    
LMH6715 Dual Wideband Video Op Amp resource download icon Test Report    
LM117 3-Terminal Adjustable Regulator resource download icon Test Report resource download icon Test Report resource download icon Test Keys
LM124 Low Power Quad Operational Amplifier resource download icon Test Report resource download icon Test Report resource download icon Test Keys
LM137 3-Terminal Adjustable Negative Regulator resource download icon Test Report resource download icon Test Report resource download icon Test Keys
LM136 Reference Diode resource download icon Test Report resource download icon Test Report resource download icon Test Keys
LM139 Low Power Low Offset Voltage Quad Comparator resource download icon Test Report resource download icon Test Report resource download icon Test Keys
LM158 Low Power Dual Operational Amplifier resource download icon Test Report    

SEE tests reports

Part Number Description Report
ADC08D1000
Commercial die
Dual 1GSPS 8bit Low Power CMOS ADC designed in Germany resource download icon Test Report
ADC08D1000
Space die
RHBD Space version Dual 8 bit 1 GSPS Low Power CMOS ADC designed in Germany resource download icon Test Report
ADC14155
RHBD Space version 14bit 155MSPS Low Power CMOS ADC
resource download icon Test Report

Cannot find the radiation report that you need ?
National Semiconductor GmbH is open to redefine and prioritise its plans for future radiation testing in order to meet your needs.
Please notify Paul McCormack at National Semiconductor about which radiation tests you would like National Semiconductor to perform and share on ESCIES.

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