ESA / SCC Basic Specifications

The ESA/SCC System is OBSOLETE and is Superseded by the ESCC System .

Basic Specifications

All specification links are to pdf files with an average file size of 1 to 2 MB.

Doc. or Spec. No.	Issue	Rev.	Specification Title
20100	4		Requirements for Qualification of Standard Electronic Components for Space Application
20200	3	A	Component Manufacturer Evaluation
20400	2	A	Internal Visual Inspection
20500	3	A	External Visual Inspection
20600	2	A	Preservation Packaging and Despatch of SCC Electronic Components
20800	1		Document Change Request Procedure
20900	3		Radiographic Inspection of Electronic Components
21300	4	C	Terms Definitions Abbreviations Symbols and Units
21400	3	A	Scanning Electron Microscope (SEM) Inspection of Semiconductor Dice
21500	2		Calibration System Requirements
21700	5		General Requirements for the Marking of SCC Components
22600	2	A	Requirements for the Evaluation of Standard Electronic Components for Space Application
22700	4	A	Requirements and Guidelines for the "Process Identification Document" (PID)
22800	2		ESA/SCC Nonconformance Control System
22900	4		Total Dose Steady-State Irradiation Test Method
23000	2		Requirements for the Extension of Qualification Approval of Standard Electronic Components for Space Application
23100	2		ESA/SCC Recommendations for the Evaluation and Procurement of Non-Standard Electronic Components for Space Application
23400	1		Microsection Examination Preparation and Evaluation of Capacitors Fixed Ceramic Leaded and Chips
23500	6	D	Requirements for Lead Materials and Finishes for Components for Space Application
23800	1	B	Electrostatic Discharge Sensitivity Test Method
24300	4	A	Requirements for the Capability Approval of Electronic Component Technologies for Space Application
24400	1	A	Measurement of Insertion Loss for E.M.I Suppression Filters
24600	3		Minimum Quality System Requirements
24700	1		Cross Reference of ESA/SCC US-MIL and IEC Test Methods
24800	2	A	Resistance to Solvents of Marking Materials and Finishes
24900	1		Minimum Requirements for Controlling Environmemtal Contamination of Components
25100	1		Single Event Effects Test Method and Guidelines
25200	1		Application of Scanning Acoustic Microscopy to Plastic Encapsulated Devices
25300	1		Decapsulation of Plastic Encapsulated Semiconductor Devices