| Document Properties | |
|---|---|
| Feedback to: | Alessandra Costantino |
| Published: | 13-03-2009 |
| Public Document | |
QCA Day 9
QCA & CNES Final Presentation Days
Tuesday 27th & Wednesday 28th January 2009, PSI, Villigen, Switzerland
PRESENTATIONS - DAY 1
| Welcome and Overview (Final Agenda |
Martin Jermann
Reno Harboe Sørensen Wojtek Hajdas |
Paul Scherrer Institut, CH
European Space Agency/ESTEC, NL Paul Scherrer Institut, CH |
 PDF
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Total Dose and Single Event Effects in Commercial PWM’s and Gate Drivers Radiation Evaluation of UC2843 and UC2845 from STMicroelectronics |
Stanley Mattsson | RUAG Aerospace Sweden AB, Sweden | |
| Single Event Effect Radiation Testing of LTC2449 24-Bit ADC and LTC6241 OpAmp from Linear Technology | Joerg Knollenberg | DLR, Berlin, Germany |
PDF |
| Optocoupler Study – Preliminary Analysis & Results Following Proton Testing | Daniel Peyre/Christian Binois | EADS Astrium, France |
PDF |
| Study of Radiation Effects in MEMS | Oudea Coumar | EADS Astrium, France |
PDF |
| Total Dose Test of Low Power PWM UCC1801 and UCC1806 | Sture Larsson | RUAG Aerospace Sweden AB, Sweden |
PDF |
| Update on Single Event Effects in GaAs MESFETs | Fredrik Sturesson | ESA/ESTEC, The Netherlands |
PDF |
| Experimental Validation of Fault Injection Analysis with the FLIPPER Tool | Monica Alderighi | INAF/IASF, Milano, Italy |
PDF |
| SEE and TID Radiation Test Results on ST Circuits in 65 nm CMOS Technologies | Philippe Roche | STMicroelectronics, Crolles, France |
PDF |
| Heavy Ion Energy and Tilting Effects in FLASH Memories |
Giorgio Cellere
Alessandro Paccagnella |
University of Padova, Italy |
PDF |
| Heavy Ion LET in Silicon |
Arto Javanainen
Ari Virtanen |
University of Jyväskylä, Finland |
PDF |
| Technology Demonstration Module for PROBA-II |
Koen Puimege
Nico Fleurinck |
Verhaert Space, Belgium |
PDF |
| New RADFETs for Space Applications | Aleksandar Jaksic | Tyndall National Institute, Ireland |
PDF |
| Radiation Evaluation of Samsung 8 Gbit FLASH Memories for Space Applications |
Hagen Schmidt
Fritz Gliem |
IDA, Braunschweig, Germany |
PDF |
| SEL Characterisation of SRAMs for the TDM Latch-up Experiment |
Francois-Xavier Guerre
Frederic Lochon |
HIREX Engineering, France |
PDF |
| Reverse Engineering of SRAMs Selected for the TDM |
Richard Fitzgerald
Ted O’Shea |
Tyndall National Institute, Ireland |
PDF |
| Laser Single Event Effects Studies Phase IV – Latch-up Investigations of SRAMs Selected for the TDM | Andrew Chugg | MBDA UK Ltd, United Kingdom |
PDF |
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News from the European Component Irradiation Facilities
PIF HIF/LIF RADEF ECF |
Wojtek Hajdas Guy Berger Ari Virtanen Bob Nickson |
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