| Document Properties | |
|---|---|
| Feedback to: | Alessandra Costantino |
| Published: | 24-02-2009 |
| Public Document | |
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QCA Day 9
QCA & CNES Final Presentation Days
Tuesday 27th & Wednesday 28th January 2009, PSI, Villigen, Switzerland
PRESENTATIONS - DAY 2
| Overview (final agenda) and Introduction to CNES Presentations |
Reno Harboe Sørensen
Francoise Bezerra Robert Ecoffet |
ESA/ESTEC, NL
CNES, France |
|
| LET Needs Based on SPOT Data | Robert Ecoffet | CNES, France |
 PDF |
| CARMEN2/MEX – First Set of In-Flight Data | Francoise Bezerra | CNES, France |
PDF |
| Radiation Characterisations of ST MOSFETs – Overview and Results |
Fredrik Sturesson
Francoise Bezerra |
ESA/ESTEC, The Netherlands
CNES, France |
PDF |
| Fluence Effect on SEE Response of Power MOSFETs | Daniel Peyre | EADS, Astrium, France |
PDF |
| Methodology to Predict the SEE Rate in Vertical MOSFET with Deep Charge Collection | Ronan Marec | THALES Alenia Space, France |
PDF |
| Dose Evaluation Methods Based on PMOS Embedded Results | Christian Chatry | TRAD, France |
PDF |
| Honeywell SRAM Memory SEU Sensitivity | Robert Ecoffet | CNES, France |
PDF |
| Probing with Heavy Ions the SET Sensitivity of Linear Devices | Thierry Nuns | ONERA, France |
PDF |
| TID and Dose Rate Switching Method | Jerome Boch | IES, University of Montpellier II, France |
PDF |
| Analysis of Circuits Effects in Analog Devices | Nicolas Roche | IES, University of Montpellier II, France |
PDF |
| Latent Defects | Antoine Touboul | IES, University of Montpellier II, France |
PDF |
| TPA Laser Determination of SET Sensitive Volume | Vincent Pouget | IMS Bordeuax, France |
PDF |
| SEE Characterization on Operational Amplifiers |
Geraldine Chaumont
Francoise Bezerra |
ST Rennes, France
CNES, France |
PDF |
| SET Characterization and Mitigation for Logic Circuits using the 0.18µm CMOS AT58KRHA Process for Space Use | Guy Mantelet | Atmel, France |
PDF |
| SET Study on Actel Flash FPGA |
Luca Sterpone
Massimo Violante |
Torino University, Italy |
PDF |
| Introductions to the PSI/PIF Tours | Wojtek Hajdas | Paul Scherrer Institut, Switzerland |
PDF |
