| Document Properties | |
|---|---|
| Feedback to: | Alessandra Costantino |
| Published: | 03-03-2008 |
| Public Document | |
7th QCA Final Presentation Day
7th QCA Final Presentation Day
Wednesday 25th May 2005, Jyväskylä, Finland
Reports
| Application-like Radiation Test of XTMR & FTMR Mitigation Techniques for Xilinx Virtex-II FPGA | S. Mattsson & F Sturesson | Saab | 2005-05-20 |
pdf
|
| Co-60 TID Evaluation of SDRAMs from Elpida, EDS2508APTA 256Mbit, from Samsung, K4S510432B 512Mbit, and from Micron, MT48LC16M8A2 128Mbit, using Auto-refresh & Self-refresh Mode of Bias Operation | F-X Guerre & J-F Pascal | Hirex | 2005-05-20 |
EDS2508APTA
K4S510432B
MT48LC16M8A2
|
| Heavy Ion Characterisation of AC/HC Logic Circuits at 2.5V, 3.3V & 5.0V from STM & NS Using : 54AC/HC08, 54Ac/HC157, 54AC/HC273, 54AC257, 54AC244, 54HC4040 & 54HC4053 Types | S. Mattsson & F Sturesson | Saab | 25-05-05 |
pdf
|
| Radiation Co-60 TID Evaluation of 16-Bit Analog-to-Digital Converters : Texas Instruments ADS8402, Analog Devices AD7677 & AD9260 | F-X Guerre & J-F Pascal | Hirex | 2005-05-20 |
ADS8402
AD7677A
AD9260
|
| Heavy Ion Effects on Low Voltage LVDS Line Driver / Receiver from NS | S. Mattsson & S Larsson | Saab | 2005-06-06 |
pdf
|
| SEE & TID Acceptance Tests of the Radiation Test-Bed for High Capacity Memory Systems | M Bruggemann, H Schmidt & H Michalik | IDA | 2005-06-06 |
SEE
TID
|
| Heavy Ion Effects in UCC1806 & UC1825A Pulse Width Modulators | S. Mattsson & S Larsson | Saab | 2005-06-06 |
pdf
|
| Laser Simulation of Single Event Effects in Pulse Width Modulators & Memories | A Chugg | MBDA UK | 2005-06-06 |
pdf
|
| Constructional Analysis of UCC1806 & UC1825A Pulse Width Modulators | T O'Shea & R Fitzgerald | Tyndall National Institute | 2005-06-06 | on request |
| SEE Characterisation of Parts for the ATV Project : UC1706 Dual Output Driver, OP400Y Operational Amplifier & M27C512 UV EPROM | F-X Guerre | Hirex | 2005-06-06 |
UC1706
OP400Y
M27C512
|
| Heavy Ion SEL Test for the RAL CDS/ADC CCD Video Processing ASIC MK-6 | P Thomas, M Hailey & R Harboe Sorensen | MSSL / ESA | 2005-06-06 |
pdf
|
| Summary & Results of Enhanced Low Dose Rate Effects (ELDRS) Testing Performed at the ESTEC Co-60 Facility | C Renaudie, B Nickson & A Mohammadzadeh | ESA/ESTEC | 2005-05-20 |
LM117
OP400
OP484
2N2222A
|
Presentation Material
| Welcome & Overview (final agenda) | R. Harboe-Sorensen | ESA | 2005-05-20 |
Agenda
Reports
|
| Application-like Radiation Test of XTMR & FTMR Mitigation Techniques for Xilinx Virtex-II FPGA | S. Mattsson & F Sturesson | Saab | 2005-05-20 |
pdf
|
| Co-60 TID Evaluation of SDRAMs from Elpida, EDS2508APTA 256Mbit, from Samsung, K4S510432B 512Mbit, and from Micron, MT48LC16M8A2 128Mbit, using Auto-refresh & Self-refresh Mode of Bias Operation | F-X Guerre & J-F Pascal | Hirex | 2005-05-20 |
pdf
|
| RADFET Read-out Systems for Ground Calibration & Biopan-4 Experiment | A Jaksic & V Ogourtsov | Tyndall National Institute | 2005-06-16 |
pdf
|
| Heavy Ion Characterisation of AC/HC-Logic Circuits at 2.5V, 3.3V & 5.0V from STM and NS Using : 54AC/HC08, 54AC/HC157, 54AC/HC273, 54AC257, 54AC244, 54HC4040 & 54HC4053 Types | S Larsson & S Mattsson | SAAB | 2005-05-20 |
pdf
|
| Random Telegraph Signals in CCDs & Active Pixel Sensors | G Hopkinson | SIRA | 2005-05-20 |
pdf
|
| Radiation Co-60 TID Evaluation of 16-Bit Analog-to-Digital Converters : Texas Instruments ADS8402, Analog Devices AD7677 & AD9260 | F-X Guerre & J-F Pascal | Hirex | 2005-05-20 |
pdf
|
| Heavy Ion Effects on Low Voltage LVDS Line Driver / Receiver from NS | S Mattsson & S Larsson | SAAB | 2005-05-20 |
pdf
|
| SEE & TID Acceptance Tests of the Radiation Test-Bed for High Capacity Memory Components | M Bruggemann, H Schmidt & H Michalik | IDA | 2005-06-16 |
pdf
|
| High Energy Proton Damage Assessment of 90nm Node Multiple Gate Oxide Thickness Transistors | E Simoen, M-L David & C Claeys | IMEC | 2005-05-20 |
pdf
|
| Heavy Ion Effects in UCC1806 & UC1825A Pulse Width Modulators | S Larsson & S Mattsson | SAAB | 2005-05-20 |
pdf
|
| Laser Simulation of Single Event Effects in Pulse Width Modulators & Memories | A Chugg | MBDA UK Ltd | 2005-05-20 |
pdf
|
| Construction Analysis of UC1806 & UC1825A Pulse Width Modulators | T O'Shea & R Fitzgerald | Tyndall National Institute | 2005-05-20 |
pdf
|
| SEE Characterisation of Parts for the ATV Project : UC1706 Dual Output Driver, OP400Y Operational Amplifier & M27C512 UV EPROM | F-X Guerre | Hirex | 2005-06-16 |
pdf
|
| Heavy Ion SEL Test for the RAL CDS / ADC CCD Video Processing ASIC MK-6 | P Thomas, M Hailey & R Harboe Sorensen | MSSL UK & ESA | 2005-05-20 |
pdf
|
| Radiation SEE Evaluation of High Capacity Flash Memory Devices for SafeGuard Data Recorder | M Bruggemann, H Schmidt & H Michalik | IDA | 2005-06-16 |
pdf
|
| Summary & Results of Enhanced Low Dose Rate Effects (ELDRS) Testing Performed at the ESTEC Co-60 Facility | C Renaudie, B Nickson & A Mohammadzadeh | ESA/ESTEC | 2005-05-20 |
pdf
|
| Summary & Results of Recent Proton Testing Carried Out on COTS Components for the LHC | F Faccio & T Wijnands | CERN | 2005-05-20 |
pdf
|
