CNES / ESA Final Presentation Days 2011

28th and 29th March 2011

ESTEC / ESA ( The Netherlands )

Radiation Characterization of various FRAM, SRAM and Flash Memories by Frederic Lochon, ALTER

SEGR on Power MOSFETs - Nathalie Chatry, TRAD

In flight data from CARMEN2/MEX experiment: SEE on memories - Anne Samaras, CNES

Reverse Monte Carlo tools in FASTRAD -Pierre Pourrouquet, TRAD

Displacement damage, defects generation in image sensors -Christophe Inguimbert, ONERA

Influence of gamma and proton radiation on COTS Silicon and Indium Phosphide based photodiodes and determination of end-of-mission performance through modeling - Guillaume Pedroza ADVEOTEC

Dose rate and static/dynamic bias effects on CCDs degradation - Thierry Nuns, ONERA

Characterization, modeling and storage of radiation induced attenuation within optical fibres -Matthieu Caussanel, Université de Perpignan

Reliability assessment of optoelectronic and photonic devices in severe environments: architecture and applications of the OpERaS consortium -Laurent Bechou, Piero Spezzigu, IMS

MUSCA SEP3, a Mulit-Scale and Multi-Physics method to investigate the Single Event Effects for Space Mission -Sophie Duzellier, ONERA

Optimisation of SEE rates predictions - Nicolas Sukhaseum, TRAD

RadFET development and calibration - Aleksandar Jaksic, Tyndall

ACTEL Flash FPGA irradiation tests results - Michael Grandjean, ALTER

Irradiation characterization of DDR2 and SDRAM -Michael Grandjean, ALTER

Studies of Radiation SEE Effects in NAND-Flash and DDR types of memories - Fritz Gliem, Kai Grürmann, Dietmar Walter, IDA

SEE radiation test results in 90-65-45-40-32nm technologies - Philippe Roche, Gilles Gasiot, ST Microelectronics

Radiation Assessment of DSM CMOS devices - Cor Claeys, Eddy Simoen, IMEC

PSI radiation test facility status report - Wojtek Hajdas, PSI

UCL irradiation test facility status report -Guy Berger, UCL

RADEF irradiation test facility status report - Ari Virtanan, Jyväskylä University

Verification of Enhanced low dose rate sensitivity accelerated test method - Peter Beck, AIT

Study of ELDRS dose rate dependency - Sophie Duzellier, ONERA

SEGR/SEB Radiation Test Method Study - Christian Binois, EADS Astrium

Using TPA laser testing for characterizing the depth of SEE sensitive volumes - Frederic Darracq, IMS

Improvements of laser bench test set-up and its validation by testing memories - Andrew Chugg, MBDA

Integrated Radiation Environment, Effects and Component Degradation Simulation Tool - Ana Keating, LIP/ESA

Technology Demonstration Module On-Board PROBA-II - Reno Harboe-Sørensen

ESA year 2011 - Ongoing / new component radiation effects related R&D activities - Ali Zadeh, ESA