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Feedback to:	Alessandra Costantino
Published:	13-02-2015
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ESA - CNES Final Presentation days 2015

9-10 March 2015
CCT Toulouse, France

9 March 2015 (all presentations )

SESSION 1	Facilities, dosimetry and hardening techniques	F. Bezerra	CNES
1	MIRAGE: A new proton facility for the study of direct ionization in sub-100nm technologies	S. Duzellier	ONERA
2	A new laser facility at CNES for the study of SEE behavior of electronic devices	K. Sanchez	CNES
3	BET-C: The new portable Beam Evaluation Tool from CNES	F. Bezerra	CNES
4	Shielding optimization: methodology at system level	J. C. Thomas	TRAD
SESSION 2	Radiation effects on ICs	R. Ecoffet	CNES
5	Heavy-Ion and Total Ionizing Dose performance of different memory technologies (Flash, DDR3, MRAM and SRAM)	F. Tilhac	HIREX
6	Experimental Characterization and simulation of Electron-induced SEU in 45nm CMOS Technology	A. Samaras	TRAD
7	A Calculation Method for Proton Direct Ionization Induced SEU rate from Experimental Data: Application to Commercial 45nm FPGA	N. Sukhaseum	TRAD
8	Evidence of destructive Single Event Latch-up on various devices using TILU2 test system	F. Bezerra	CNES
9	ATMX150RHA Rad-Hard Platform, the solution for mixed-signal ASIC	D. Truyen	ATMEL Nantes SAS
SESSION 3	Radiation effects on optoelectronics	M. Boutillier	CNES
10	Cryogenic radiation facility (80K): validation of CNES cryostat on UCL HIF facility	B. Baradat M. Boutillier	CNES
11	Single Event Upset Sensitivity of F-Latch in Infrared Image Sensors for Low Temperature Applications	L. Artola	ONERA
12	Low temperature total dose irradiation of different transistor topologies for infrared applications	T. Nuns	ONERA
13	Commercial Light Emitting Diodes sensitivity to proton radiations	M. Boutillier	CNES
14	Radiation effects on digital CMOS image sensors using micro lenses and color filters	A. Toulemont	CNES
SESSION 4	ESA R&D activities, Cubesat and CODES	A. Zadeh	ESA
	ESA RHA R&D activities overview	A. Zadeh	ESA
15	Radiation Effects Study by SEE Experiment on Cubesat	V. Gupta	University Montpellier 2
16	Component Degradation Simulation (CODES) framework	P. Gonçalves	LIP
17	GaAs power devices and Mixed signal technologies	C. Boatella Polo	ESA
18	Radiation Characterization of GaAs power devices in support of European Radiation Hardness	C. Boatella Polo	ESA
19	Radiation Characterization of RT analogue/mixed signal technology	C. Boatella Polo	ESA

10 March 2015 (all presentations)

SESSION 5	Radiation test of various ICs - COTS and APS	M. Poizat	ESA
20	Radiation characterization of European COTS EEE components for space applications	J. Bagalkote P.Beck	Seibersdorf Lab.
21	Total Ionizing Dose influence on the single event effect sensitivity of active EEE components	A. Samaras	TRAD
22	HAS2 wafer lot acceptance testing	Petros Chrysogelos	OnSemi
SESSION 6	Memories, SETs, power MOSFETs	V. Ferlet-Cavrois	ESA
23	Studies of radiation effects in new generations of non-volatile memories	S. Gerardin, M. Bagatin	Univ. Padova
24	Radiation Testing Of Candidate Memory Devices, DDR3 and NAND-Flash	K. Grürmann, M. Herrmann, H. Schmidt	Airbus & IDA
25	Advanced Techniques for Radiation Characterization of ProASIC3 FPGAs	A. Evans	iRoC
26	Test vehicle in STMicroelectronics 65nm technology	M. Glorieux, A. Evans	iRoC
27	Statistical SEGR radiation test method study in power MOSFETs	A. Carvalho, C. Binois	Airbus Elancourt
SESSION 7	Component testing and in-flight data	C. Poivey	ESA
28	Heavy Ion Single Event Effect characterization of ATMEL AT7913 Space Wire Remote Terminal Controller	E. LeGoulven	TRAD
29	High dose rate and low dose rate testing of STmicroelectronics TS4061 voltage reference	F. Widmer	TRAD
30	Heavy Ion Single Event Effect testing of STmicroelectronics RHFPM4424 low side MOSFET driver	P. Garcia	TRAD
31	Proton and Heavy Ion Multiple Bit Upset (MBU) testing of ATMEL M65609E 1Mbit SRAM	P. Garcia	TRAD
32	TID testing of Analog to Digital Converter and Digital to Analog Converter	F. Tilhac	HIREX
33	SEE testing of Analog to Digital Converter and Digital to Analog Converter, comparison of different test methods	C. Poivey	ESA
34	Update on SRAM flight data on board PROBA-2 TDM and ALPHASAT TDP8	C. Poivey	ESA
SESSION 8	Facilities	V. Ferlet-Cavrois	ESA
35	UCL irradiation test facility status report	N. Postiau, L. Standaert	UCL
36	RADEF irradiation test facility status report	A. Virtanen	Jyväskylä Univ.
37	PSI irradiation test facility status report	W. Hajdas	PSI
38	ESTEC Co60 source facility status report	A. Costantino	ESTEC

ESA - CNES Final Presentation days 2015

SESSION 1

Facilities, dosimetry and hardening techniques

SESSION 2

Radiation effects on ICs

SESSION 3

Radiation effects on optoelectronics

SESSION 4

ESA R&D activities, Cubesat and CODES

SESSION 5

Radiation test of various ICs - COTS and APS

SESSION 6

Memories, SETs, power MOSFETs

SESSION 7

Component testing and in-flight data

SESSION 8

Facilities

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