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Feedback to: | Alessandra Costantino |
Published: | 10-12-2009 |
Public Document |
QCA Day 8
QCA Final Presentation Day
Tuesday 23rd & Wednesday 24th January 2007, Louvain-La-Neuve, Belgium
PRESENTATIONS - DAY 1
Final Agenda Welcome and Overview |
Reno Harboe Sørensen | European Space Agency/ESTEC, NL |
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Particle Test of Xilinx Virtex-II FPGA using XTMR Mitigation Technique | Fredrik Sturesson | Saab Ericsson Space, Sweden/ESA-ESTEC, NL |
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Summary of Radiation Data Available on Actel, Xilinx and Atmel FPGA | Fredrik Sturesson | Saab Ericsson Space, Sweden/ESA-ESTEC, NL |
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Modelling of Radiation SEE on Components | Ana Keating | LIP, Lisbon, Portugal |
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Radiation Testing of AMI 0.35 um and UMC 0.18 um – Radiation Tolerant and Normal Layout Devices | Steven Leussink | SRON, The Netherlands |
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On-going and Planned RADFET Developments | Aleksandar Jaksic | Tyndall National Institute, Ireland |
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Proton Testing of Micro Advanced Stellar Compass | Helle Karina Aage, Peter Buch Guldager | DTU, Denmark |
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Radiation Evaluation of ST Test Structures in 130 nm, 90 nm and 65 nm Technologies | Philippe Roche | STMicroelectronics, Crolles |
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Radiation Testing of Innovative GPS-Receiver - Two ASIC IC’s designed in AMS 0.35 um Technology |
Angelo Consoli Francesco Piazza |
NemeriX, Switzerland |
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Proton Irradiation of the STAR1000 Active Pixel Sensor: Preliminary Results on NIEL Scaling | Ludovic Duvet | ESA/ESTEC, The Netherlands |
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Random Telegraph Signals in CCDs and Active Pixel Sensors | Gordon R. Hopkinson | SSTL, UK |
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Laser Single Event Effects Studies - Phase III | Andrew Chugg | MBDA UK Ltd, United Kingdom |
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Heavy Ion SEE Testing of Delta VPT DC-DC Converters for PROBA-II | Sven Landstrom | ESA/ESTEC, The Netherlands |
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Linear Energy Transfer Measurements of Heavy Ions in Silicon |
Ari Virtanen Arto Javanainen |
University of Jyväskylä, Finland |
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Low Dose Rate TID Testing of Candidate Components for ESA Projects |
Ali Mohammedzadeh Bob Nickson |
ESA/ESTEC, The Netherlands |
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News from the European Component Irradiation Facilities : PIF | Wojtek Hajdas | PSI, Switzerland |
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News from the European Component Irradiation Facilities : HIF | Guy Berger | UCL/CRC, Louvain-la-Neuve, Belgium |
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News from the European Component Irradiation Facilities : RADEF | Ari Virtanen | University of Jyväskylä, Finland |
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News from the European Component Irradiation Facilities : ECF | Bob Nickson | ESA/ESTEC, The Netherlands |
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FINAL REPORTS
OP200 - Low Dose Rate Testing | Bob Nickson & Ali Mohammadzadeh | ESA/ESTEC, The Netherlands |
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LM158 - Low Dose Rate Testing | Bob Nickson & Ali Mohammadzadeh | ESA/ESTEC, The Netherlands |
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UC1842 - Low Dose Rate Testing | Bob Nickson & Ali Mohammadzadeh | ESA/ESTEC, The Netherlands |
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UC1845 - Low Dose Rate Testing | Bob Nickson & Ali Mohammadzadeh | ESA/ESTEC, The Netherlands |
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2N3810 - Low Dose Rate Testing | Bob Nickson & Ali Mohammadzadeh | ESA/ESTEC, The Netherlands |
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2N5154 - Low Dose Rate Testing | Bob Nickson & Ali Mohammadzadeh | ESA/ESTEC, The Netherlands |
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PRESENTATIONS - DAY 2
Overview (final agenda) and Introduction to CNES Presentations |
Francoise Bezerra Robert Ecoffet |
CNES, France |
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Compendium of 2006 CNES Radiation Evaluation Tests Results on Commercial Integrated Circuits | Florence Malou | CNES, France |
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Advances in Research on Radiation Effects on Optic and Optoelectronic Components Part 1 | T. Nuns | ONERA, France |
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Advances in Research on Radiation Effects on Optic and Optoelectronic Components Part 2 |
P. Signoret L.Trousselier |
CEM2, France |
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Switched Dose Rates as an Alternative Method for ELDRS Testing |
Francoise Bezerra Jérôme Boch Frederic Saigné |
CEM2, France |
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New Insights into SEGR and SEB mechanisms in power MOSFETs | Daniel Peyre | EADS-Astrium, France |
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Probing SEE Sensitive Volumes Using a Focused Laser Beam | Cecile Weulersse | EADS-CCR, France |
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SEE Testing of Advanced Memories Part I: Test Approach and Sample Preparation |
F-X Guerre Gregoire Lewis |
HIREX Engineering, France |
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SEE Testing of Advanced Memories Part II: Heavy Ion Results on SDRAMs and Preliminary Results on DDR-II |
F-X Guerre Gregoire Lewis |
HIREX Engineering, France |
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Compendium of 2006 CNES Radiation Evaluation Tests Results on Commercial Memories | Jean Bertrand | CNES, France |
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Further Heavy Ion and Proton SEE Evaluation of High Capacity FLASH Memory Devices for SafeGuard Data Recorder |
M. Brüggemann H. Schmidt H. Michalik F. Gliem |
IDA, Braunschweig, Germany |
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Study of Heavy Ion Radiation Effects in FLASH Memories |
Alessandro Paccagnella Giorgio Cellere |
University of Padova, Italy |
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European Component Initiative: STM Power MOS Development | Ralf de Marino | ESA/ESTEC, NL | |
GAIA PEM Radiation Test Program – SEL testing of 13 IC’s |
Reno Harboe Sørensen Phil Guttridge Mark Hailey |
MSSL, UK |
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Upgrade of the Light-Ion Irradiation Facility (LIF) at Louvain-la-Neuve | Guy Berger | UCL/CRC, Louvain-la-Neuve, Belgium |
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RADECS Workshop
Thursday 25th January 2007, Louvain-La-Neuve, Belgium
PRESENTATIONS
Heavy Ion Space Environments/ Project LET Requirements – I.
Chairs: Reno Harboe Sørensen & Guy Berger
Round Table 1.
Welcome and Scope of Workshop Agenda Post Workshop Analysis |
Reno Harboe Sørensen |
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Modelling the Space Radiation Environment |
Giovanni Santin Eamonn Daly |
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In-Flight Experiments/Monitors New Data & Status |
Robert Ecoffet |
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In-Flight Observed Singe Event Effects | Renaud Mangeret |
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Overview of Space Project LET Requirements |
Michel Melotte Ronan Marec |
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Practical Interpretation of LET Requirements |
Fredrik Sturesson Stanley Mattsson |
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Manufacturer Imposed LET Requirements | Nicolas Renaud |
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NASA - Summary of LET Requirements/Testing | Ray Ladbury |
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JAXA - Summary of LET Requirements/Testing | Satoshi Kuboyama |
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Chairs: Renaud Mangeret, Giovanni Santin & Nicolas Renaud
Introduction |
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Do We Need Changes to Current LET Requirements ? |
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SEE Test Facilities/Testing – SEE Modelling – II.
Chairs: Nicolas Renaud & Reno Harboe Sørensen
Test Facility Status & Test Conditions | Reno Harboe Sørensen |
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Lessons Learned from SEE Testing | Michel Melotte |
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SEE Modelling/Prediction | Fredrik Sturesson |
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Round Table 2.
Chairs: Robert Ecoffet, Giovanni Santin & Michel Melotte
Introduction | Robert Ecoffet |
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SEE Prediction Tools & Results | Open Forum |
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Conclusions RT 1 & 2 | Reno Harboe Sørensen |
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